IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Control via DOS Middleware Instrumentation

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): H. Cui ; J. Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 2,344 - 2,348
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604597
Regular:

One of the important issues in testing distributed applications is to provide automated control of the non-determinism by guarding the inter-process communications, forcing the execution along the... View More

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