IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling on Parallel Test System Based on Object-Oriented

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Zhu Xiao-ping ; Xiao Ming-qing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 2,076 - 2,081
ISBN (Paper): 0-7803-8879-8
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2005.1604539
Regular:

Compared to traditional sequence test, parallel test, which means multiple units-under-test (UUTs) can undergo testing simultaneously, can improve test throughput by increasing the number of test... View More

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