IEEE - Institute of Electrical and Electronics Engineers, Inc. - Generalized Analysis Model for Fringe Pattern Profilometry

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Yingsong Hu ; Jiangtao Xi ; Zongkai Yang ; Enbang Li ; J. Chicharcr
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 1,951 - 1,955
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604512
Regular:

In this paper, a generalized analysis model for fringe pattern profilometry is presented. The new analysis model is derived mathematically, which describes the essential relationships between... View More

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