IEEE - Institute of Electrical and Electronics Engineers, Inc. - Virtual Instruments Based on Stacked Neural Networks to Improve Product Quality Monitoring in a Refinery

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): L. Fortuna ; P. Giannone ; S. Graziani ; M.G. Xibilia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 1,889 - 1,893
ISBN (Paper): 0-7803-8879-8
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2005.1604500
Regular:

A virtual instrument, based on neural networks, for the estimation of octane number in the gasoline produced by refineries is introduced. The stacking approach is proposed to improve the... View More

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