IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Method for I/Q Impairment Evaluation in OFDM Transmitters

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): L. Angrisani ; I. Ghidini ; M. Vadursi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 1,842 - 1,847
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604491
Regular:

The paper focuses the attention on orthogonal frequency division multiplexing (OFDM) digital transmitter testing and troubleshooting, with particular regard to I/Q impairment detection and... View More

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