IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and non-BIT) Systems in a Operational U.S. Navy Fighter/Attack Squadron

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): J.J. Woell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 1,836 - 1,841
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604490
Regular:

This paper will outline the process and 'real-world' experience of applying trending techniques to supporting a highly complicated system within a high pressure environment with an extremely low... View More

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