IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of Rotating Machine Sources for Fault Diagnostics using Independent Component Analysis

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Sung-Hwan Han ; Hyeon-Ho Kim ; Hyeon-Deok Bae
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,507 - 1,512
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604403
Regular:

In this paper we introduce the use of independent component analysis for extraction of machine signal from noisy measurements. ts. The presence of interference noise at the machine defect... View More

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