IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave Reflectometry as a Novel Diagnostic Method for Detection of Skin Cancers

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): K. Chand ; P. Mehta ; D.G. Beetner ; R. Zoughi ; W.V. Stoecker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,425 - 1,428
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604385
Regular:

More than one million people are diagnosed with skin cancer each year in the United States and more than ten thousand people die from the disease. Currently, there are some methods for early... View More

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