IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of Single Drive Electrode Electrical Resistance Tomography System

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Junwen Liu ; Feng Dong ; Yanbin Xu ; Huaxiang Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,411 - 1,416
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604382
Regular:

A new data acquisition strategy, namely the single drive electrode method used in electrical resistance tomography (ERT) system, is introduced in this paper. The ERT system based on the method has... View More

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