IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Investigation On The Nonlinearity Of `Soft' Field In Electrical Impedance Tomography System Based On Statistical Methods

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Huaxiang Wang ; Zhang Cao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,392 - 1,396
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604378
Regular:

In this paper, the nonlinearity in the electrical impedance tomography (EIT) system has been studied based on two statistical methods: the graph method and the uniform design method. The results... View More

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