IEEE - Institute of Electrical and Electronics Engineers, Inc. - Precise Measurement of Dark Bridge between Micro-gap Electrical Contacts in a State of Thermal Equilibrium Condition

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): H. Ishida ; M. Taniguchi ; T. Takagi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,301 - 1,306
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604358
Regular:

Newly discovered nonluminous (dark) bridge was precisely produced and measured its size by microscopic means. Palladium (Pd) was tested as a typical contact material. The contacts separating... View More

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