IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel ultra sensitive method for voltage noise measurements

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): F. Crupi ; G. Giusi ; C. Ciofi ; C. Pace
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,190 - 1,193
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604334
Regular:

Ultra low noise measurements often require the application of signal processing and correction techniques to go beyond the noise performances of front-end amplifiers. In this paper, we propose a... View More

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