IEEE - Institute of Electrical and Electronics Engineers, Inc. - Circuit Testing Using Self-Nonself Discrimination

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): C.P. Souza ; R.C.S. Freire ; R.M. Assis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 2
Page(s): 1,186 - 1,189
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604333
Regular:

Built-in self-test (BIST) techniques are rapidly becoming an industry-wide standard test technique in the design of testing support hardware for VLSI circuits. In the BIST setup both test pattern... View More

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