IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new body-effect elimination technique for ISFET measurement

2005 IEEE Sensors

Author(s): Wen-Yaw Chung ; D.O. Pijanowska ; W. Torbicz ; Chung-Huang Yang ; P.B. Grabiec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Irvine, CA, USA
Conference Date: 30 October 2005
Page Count: 4
ISBN (Paper): 0-7803-9056-3
DOI: 10.1109/ICSENS.2005.1597882
Regular:

This paper presents a new circuit technique to reduce the body-effect for more accurate ISFET measurement. In a floating source readout configuration, the most popular n-channel ISFET in a p-type... View More

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