IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interface Characterization of Molecular-Monolayer/SiO/sub 2/ Based Molecular Junctions

2005 International Semiconductor Device Research Symposium

Author(s): C.A. Richter ; C.A. Hacker ; L.J. Richter ; O.A. Kirillov ; E.M. Vogel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Bethesda, MD, USA
Conference Date: 7 December 2005
Page Count: 2
Page(s): 234 - 235
ISBN (Paper): 1-4244-0083-X
DOI: 10.1109/ISDRS.2005.1596070
Regular:

The properties of monolayers of molecules on thin SiO2 are of great interest for future hybrid Si-molecular device technologies. We present here a correlation of the results of... View More

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