IEEE - Institute of Electrical and Electronics Engineers, Inc. - Large Temperature Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Electron/Single-Hole Transistor

2005 International Semiconductor Device Research Symposium

Author(s): M. Kobayashi ; K. Miyaji ; M. Saitoh ; T. Hiramoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Bethesda, MD, USA
Conference Date: 7 December 2005
Page Count: 2
Page(s): 173 - 174
ISBN (Paper): 1-4244-0083-X
DOI: 10.1109/ISDRS.2005.1596038
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