IEEE - Institute of Electrical and Electronics Engineers, Inc. - High Quality Epitaxially-grown InAs on GaP Substrates

2005 International Semiconductor Device Research Symposium

Author(s): A. Yulius ; J.M. Woodall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Bethesda, MD, USA
Conference Date: 7 December 2005
Page Count: 1
Page(s): 147
ISBN (Paper): 1-4244-0083-X
DOI: 10.1109/ISDRS.2005.1596023
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