IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of Leakage-Induced Photon Emission processes in sub-90 nm CMOS Devices

2005 International Semiconductor Device Research Symposium

Author(s): Y. Weizman ; M. Gurfinkel ; A. Margulis ; Y. Fefer ; Y. Shapira ; E. Baruch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Bethesda, MD, USA
Conference Date: 7 December 2005
Page Count: 2
Page(s): 44 - 45
ISBN (Paper): 1-4244-0083-X
DOI: 10.1109/ISDRS.2005.1595968
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