IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scaling Rules for Tunnel Field-Effect Transistors

2005 International Semiconductor Device Research Symposium

Author(s): K.K. Bhuwalka ; M. Born ; M. Schindler ; I. Eisele
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Bethesda, MD, USA
Conference Date: 7 December 2005
Page Count: 2
Page(s): 13 - 14
ISBN (Paper): 1-4244-0083-X
DOI: 10.1109/ISDRS.2005.1595952
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