IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel method of predicting gamma-turns using SVM and multiple alignment profiles

Proceedings of 2005 International Symposium on Intelligent Signal Processing and Communication Systems

Author(s): Qiang Li ; Yanda Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Hong Kong, China, China
Conference Date: 13 December 2005
Page(s): 457 - 460
ISBN (Paper): 0-7803-9266-3
DOI: 10.1109/ISPACS.2005.1595445
Regular:

From both the structural and functional point of view, tight turns play an important role as well as /spl alpha/-helix and /spl beta/-sheet, /spl gamma/-turn, the second most characterized and... View More

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