IEEE - Institute of Electrical and Electronics Engineers, Inc. - Prediction of beta-turn types using SVM and evolutionary information

Proceedings of 2005 International Symposium on Intelligent Signal Processing and Communication Systems

Author(s): Qiang Li ; Yanda Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Hong Kong, China, China
Conference Date: 13 December 2005
Page(s): 453 - 456
ISBN (Paper): 0-7803-9266-3
DOI: 10.1109/ISPACS.2005.1595444
Regular:

/spl beta/-turn, a majority of tight turn which is one of the three most important structural features after /spl alpha/-helix and /spl beta/-sheet, plays an important role in protein folding and... View More

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