IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fringe pattern profilometry based on inverse function analysis

Proceedings of 2005 International Symposium on Intelligent Signal Processing and Communication Systems

Author(s): Yingsong Hu ; Jiangtao Xi ; Enbang Li ; J. Chicharo ; Zongkai Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Hong Kong, China, China
Conference Date: 13 December 2005
Page(s): 61 - 64
ISBN (Paper): 0-7803-9266-3
DOI: 10.1109/ISPACS.2005.1595346
Regular:

In this paper, we proposed a new algorithm, referred to as inverse function analysis (IFA) method based on the derived mathematical model to reconstruct 3-D surfaces using fringe pattern... View More

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