IEEE - Institute of Electrical and Electronics Engineers, Inc. - Potential response of genetic field effect transistor to charged nanoparticle-DNA conjugate

Digest of Papers Microprocesses and Nanotechnology 2005. 2005 International Microprocesses and Nanotechnology Conference

Author(s): T. Sakata ; Y. Miyahara
Sponsor(s): Japan Soc. of Appl. Phys
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Tokyo, Japan, Japan
Conference Date: 25 October 2005
Page(s): 42 - 43
ISBN (Paper): 4-9902472-2-1
DOI: 10.1109/IMNC.2005.203728
Regular:

In this study, we report the potential response and the improvement of detection sensitivity of genetic FET by introducing the charged nanoparticle-DNA conjugate. When oligonucleotides probes, of... View More

Advertisement