IEEE - Institute of Electrical and Electronics Engineers, Inc. - Towards a model for estimating image difficulty in X-ray screening

Proceedings of the IEEE 39th International Carnahan Conference on Security Technology

Author(s): A. Schwaninger ; S. Michel ; A. Bolfing
Sponsor(s): IEEE Lexington Sect., USA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Las Palmas, Spain
Conference Date: 11 October 2005
Page(s): 185 - 188
ISBN (Paper): 0-7803-9245-0
DOI: 10.1109/CCST.2005.1594875
Regular:

In this study, we developed a first computational model for estimating image difficulty of X-ray images of passenger bags. Based on Schwaninger (2003) three image-based factors are proposed as... View More

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