IEEE - Institute of Electrical and Electronics Engineers, Inc. - A cross-site patch management model and architecture design for large scale heterogeneous environment

Proceedings of the IEEE 39th International Carnahan Conference on Security Technology

Author(s): Chuan-Wen Chang ; Dwen-Ren Tsai ; Jui-Mi Tsai
Sponsor(s): IEEE Lexington Sect., USA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Las Palmas, Spain
Conference Date: 11 October 2005
Page(s): 41 - 46
ISBN (Paper): 0-7803-9245-0
DOI: 10.1109/CCST.2005.1594837
Regular:

Many reports indicated that most damages caused by computer viruses and hackers' attacks are due to management problems. Computing environments implementing well managed patch management processes... View More

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