IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fitting ear contour using an ovoid model

Proceedings of the IEEE 39th International Carnahan Conference on Security Technology

Author(s): L. Alvarez ; E. Gonzalez ; L. Mazorra
Sponsor(s): IEEE Lexington Sect., USA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Las Palmas, Spain
Conference Date: 11 October 2005
Page(s): 145 - 148
ISBN (Paper): 0-7803-9245-0
DOI: 10.1109/CCST.2005.1594829
Regular:

Ear analysis is an emergent biometric application. The main advantages are the no requirement for subject contact and acquisition without demand. To recognize a subject's ear, we aim to extract a... View More

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