IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uncertainty in optical measurement applications: a case study

Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement

Author(s): M. Brandner ; T. Thurner
Sponsor(s): IEEE Instrumentation and Measurement Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ont., Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 78 - 83
ISBN (Paper): 0-7803-8979-4
DOI: 10.1109/AMUEM.2005.1594610
Regular:

The uncertainty related to a measurement is at least as important as the measurement itself. Apart from being able to determine intervals of confidence around the final result within which the... View More

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