IEEE - Institute of Electrical and Electronics Engineers, Inc. - Converting specifications of DSP-based instruments into data suitable for Monte Carlo uncertainty estimation methods

Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement

Author(s): N. Locci ; C. Muscas ; S. Sulis
Sponsor(s): IEEE Instrumentation and Measurement Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ont., Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 62 - 67
ISBN (Paper): 0-7803-8979-4
DOI: 10.1109/AMUEM.2005.1594606
Regular:

This paper deals with the problem of convening the specifications of devices used in measurement systems based on digital signal processing into data that can be represented as probability density... View More

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