IEEE - Institute of Electrical and Electronics Engineers, Inc. - The problem of applying modern uncertainty concepts to the measurement of instrument specific parameters

Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement

Author(s): J. Wirandi ; A. Lauber ; W. Kulesza
Sponsor(s): IEEE Instrumentation and Measurement Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ont., Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 39 - 44
ISBN (Paper): 0-7803-8979-4
DOI: 10.1109/AMUEM.2005.1594601
Regular:

This paper present discusses a number of problems that occurs when implementing GUM to modern instruments. These are often automatic which makes it difficult to evaluate the uncertainty components... View More

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