IEEE - Institute of Electrical and Electronics Engineers, Inc. - A polynomial chaos approach to measurement uncertainty

Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement

Author(s): T. Lovett ; F. Ponci ; A. Monti
Sponsor(s): IEEE Instrumentation and Measurement Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ont., Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 33 - 38
ISBN (Paper): 0-7803-8979-4
DOI: 10.1109/AMUEM.2005.1594600
Regular:

Measurement uncertainty is traditionally represented in the form of expanded uncertainty as is defined through the guide to the expression of uncertainty in measurement (GUM). The ISO GUM... View More

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