IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical similarity measures in image retrieval systems with categorization & block based partition

Proceedings of the 2005 IEEE International Workshop on Imaging Systems and Techniques

Author(s): Md.M. Rahman ; P. Bhattacharya ; B.C. Desai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ontaro, Canada, Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 92 - 97
ISBN (Paper): 0-7803-8922-0
DOI: 10.1109/IST.2005.1594536
Regular:

This paper presents a novel approach of similarity matching in image retrieval based on the distribution of joint feature vectors of color and texture features. Mean vectors and covariance... View More

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