IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced multispectral, multifusion, polarimetric imaging: from biophotonics to semiconductor wafers inspection and monitoring

Proceedings of the 2005 IEEE International Workshop on Imaging Systems and Techniques

Author(s): G.C. Giakos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ontaro, Canada, Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 68 - 73
ISBN (Paper): 0-7803-8922-0
DOI: 10.1109/IST.2005.1594530
Regular:

The objective of this study is to present the principles of a novel optical imaging technique, based on all active, multispectral, multifusion, spectral subtraction polarimetric imaging... View More

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