IEEE - Institute of Electrical and Electronics Engineers, Inc. - 3D shape measurements using image scanner with multiple white light sources

Proceedings of the 2005 IEEE International Workshop on Imaging Systems and Techniques

Author(s): H. Ukida ; H. Koretsune
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Niagara Falls, Ontaro, Canada, Canada
Conference Date: 13 May 2005
Page Count: 6
Page(s): 62 - 67
ISBN (Paper): 0-7803-8922-0
DOI: 10.1109/IST.2005.1594529
Regular:

In this paper, we propose a 3D shape measurement method using an image scanner which has multiple white light sources. Since the reflectance intensity depends on the object shape and color... View More

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