IEEE - Institute of Electrical and Electronics Engineers, Inc. - Conceptual Design of an Insertion Device for Non-Destructive Beam Diagnostics of A Low-Emittance Synchrotron Light Source

Proceedings of the 2005 Particle Accelerator Conference

Author(s): M. Masaki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Knoxville, TN, USA, USA
Conference Date: 16 May 2005
Page(s): 4,275 - 4,277
ISBN (Paper): 0-7803-8859-3
DOI: 10.1109/PAC.2005.1591789
Regular:

An insertion device (ID) is proposed to measure small vertical angular divergence and relative energy spread of electron beam in a low-emittance synchrotron light source. It was numerically... View More

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