IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of Built in Self Test Asynchronous Micropipeline using Double Edge Triggered D Flip Flop

2005 Annual IEEE India Conference - Indicon

Author(s): S.K. Mohideen ; J.R. Perinbam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Chennai, India, India
Conference Date: 11 December 2005
Page(s): 322 - 326
ISBN (Paper): 0-7803-9503-4
DOI: 10.1109/INDCON.2005.1590182
Regular:

Asynchronous micropipeline is a popular design style of building asynchronous circuits. This paper presents the novel idea of implementation of Built in Self Test (BIST) asynchronous micropipeline... View More

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