IEEE - Institute of Electrical and Electronics Engineers, Inc. - Business constraints drive test decisions - not vice versa

2005 IEEE International Test Conference

Author(s): Sanjiv Taneja
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA
Conference Date: 8 November 2005
Page Count: 1
ISBN (Paper): 0-7803-9038-5
DOI: 10.1109/TEST.2005.1584109
Regular:

Summary form only given. Cadence views test from the point-of-view of the goals on the manufacturing floor. The primary goal is to catch as many defects as possible with minimal total cost. The... View More

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