IEEE - Institute of Electrical and Electronics Engineers, Inc. - Panel: business constraints drive test decisions

2005 IEEE International Test Conference

Author(s): J. Schneider
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA
Conference Date: 8 November 2005
Page Count: 2
ISBN (Paper): 0-7803-9038-5
DOI: 10.1109/TEST.2005.1584108
Regular:

Semiconductor designers, manufacturers, and the subcontractors who serve these markets make many decisions about test and the infrastructure put in place to support test. These decisions have an... View More

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