IEEE - Institute of Electrical and Electronics Engineers, Inc. - Business constraints drive test decisions

2005 IEEE International Test Conference

Author(s): P. Domino
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA
Conference Date: 8 November 2005
Page Count: 1
ISBN (Paper): 0-7803-9038-5
DOI: 10.1109/TEST.2005.1584107
Regular:

The subcontract manufacturing (SCM) test business is a dynamic business, subject to constant change influenced by a variety of different forces. It has become increasingly important to examine... View More

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