IEEE - Institute of Electrical and Electronics Engineers, Inc. - Business constraints drive test decisions planning, partnerships and success

2005 IEEE International Test Conference

Author(s): M. Campbell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA
Conference Date: 8 November 2005
Page Count: 2
ISBN (Paper): 0-7803-9038-5
DOI: 10.1109/TEST.2005.1584106
Regular:

In the era of complex SOC semiconductors, the test matrices and complexity of system, manufacturing and pre-silicon design test analysis are continuously evolving, as are the demands of the... View More

Advertisement