IEEE - Institute of Electrical and Electronics Engineers, Inc. - Business constraints drive test decisions

2005 IEEE International Test Conference

Author(s): F. Muradali
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA
Conference Date: 8 November 2005
Page Count: 1
ISBN (Paper): 0-7803-9038-5
DOI: 10.1109/TEST.2005.1584105
Regular:

Test is more than transistors, tools and testers. It includes issues related to, for example, new technology development and solution hardening, the analyses and mechanics of test structure... View More

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