IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compensation terms to improve fault detection in multivariate auto-correlated processes

Proceedings of the 44th IEEE Conference on Decision and Control

Author(s): D. Lieftucht ; U. Kruger ; G.W. Irwin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Seville, Spain, Spain
Conference Date: 15 December 2005
Page(s): 3,827 - 3,831
ISBN (Paper): 0-7803-9567-0
DOI: 10.1109/CDC.2005.1582758
Regular:

This paper analyses the use of ARMA filters for detecting abnormal conditions in complex processes. Such filters were recently introduced in the multivariate statistical process control (MSPC)... View More

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