IEEE - Institute of Electrical and Electronics Engineers, Inc. - A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures

Proceedings of Symposium on Electromagnetic Compatibility

Author(s): Bronaugh, E.L. ; Osburn, J.D.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 19 August 1996
Page(s): 245 - 249
ISBN (Paper): 0-7803-3207-5
DOI: 10.1109/ISEMC.1996.561237
Regular:

The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC... View More

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