IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design automation tools for built-in self-test implementations

Conference Record. AUTOTESTCON '96

Author(s): Tungate, S. ; Ping He ; Seshadri, S. ; Stroud, C. ; Sullivan, M. ; Damarla, T.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Dayton, OH, USA, USA
Conference Date: 16 September 1996
Page(s): 113 - 119
ISBN (Paper): 0-7803-3379-9
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.1996.547685
Regular:

A suite of computer-aided design (CAD) tools is described which were developed for the automatic insertion of three different versions of circular built-in self-test (BIST) in digital circuit... View More

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