IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a TPS reuse library using COTS tools

Conference Record. AUTOTESTCON '96

Author(s): Cashar, E.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Dayton, OH, USA, USA
Conference Date: 16 September 1996
Page(s): 56 - 60
ISBN (Paper): 0-7803-3379-9
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.1996.547677
Regular:

In the past, functional test requirements (FTR) or test requirement documents (TRD) and test program sets (TPS) were standalone items developed by individual engineers. In some cases one engineer... View More

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