IEEE - Institute of Electrical and Electronics Engineers, Inc. - An overview of reliability testing challenges in integrated power amplifier modules for wireless applications

ROCS Workshop, 2005.

Author(s): Y. Qu ; P. Scott ; L. Marchut ; M. Ferrara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Indian Wells, CA, USA, USA
Conference Date: 30 October 2005
Page Count: 14
Page(s): 95 - 108
ISBN (Paper): 0-7908-0106-X
DOI: 10.1109/ROCS.2005.201556
Advertisement