IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determining factors affecting ESD failure voltage using DOE

ROCS Workshop, 2005.

Author(s): C.S. Whitman ; T.M. Gilbert ; A.M. Rahn ; J.A. Antonell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Indian Wells, CA, USA, USA
Conference Date: 30 October 2005
Page Count: 21
Page(s): 57 - 77
ISBN (Paper): 0-7908-0106-X
DOI: 10.1109/ROCS.2005.201553
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