IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scalable driver I/O macromodels for statistical analysis

Electrical Performance of Electronic Packaging

Author(s): B. Mutnury ; M. Swaminathan ; M. Cases ; N. Pham ; D.N. de Araujo ; E. Matoglu
Sponsor(s): IEEE Microwave Theory and Techniques Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA, USA
Conference Date: 24 October 2005
Page Count: 4
Page(s): 239 - 242
ISBN (Paper): 0-7803-9220-5
DOI: 10.1109/EPEP.2005.1563747
Regular:

In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today's high-speed systems. Variations in semiconductor process,... View More

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