IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact on inter symbol interference (ISI) noise due to simulation error

Electrical Performance of Electronic Packaging

Author(s): B.K. Bhattacharyya ; Bao Shu Xu ; S. Bhattacharya
Sponsor(s): IEEE Microwave Theory and Techniques Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Austin, TX, USA, USA
Conference Date: 24 October 2005
Page Count: 4
Page(s): 221 - 224
ISBN (Paper): 0-7803-9220-5
DOI: 10.1109/EPEP.2005.1563742
Regular:

In this paper, we are going to discuss the error in determining the actual intersymbol interference noise (ISI) due to different circuit simulation methodology, while using a standard circuit... View More

Advertisement