IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust particle systems for curvature dependent sampling of implicit surfaces

Proceedings. International Conference on Shape Modeling and Applications

Author(s): M.D. Meyer ; P. Georgel ; R.T. Whitaker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Cambridge, MA, USA
Conference Date: 13 June 2005
Page(s): 124 - 133
ISBN (Paper): 0-7695-2379-X
DOI: 10.1109/SMI.2005.41
Regular:

Recent research on point-based surface representations suggests that point sets may be a viable alternative to parametric surface representations in applications where the topological constraints... View More

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