IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical geometric features-extensions for cytological texture analysis

Proceedings of 13th International Conference on Pattern Recognition

Author(s): Walker, R.F. ; Jackway, P.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Vienna, Austria, Austria
Conference Date: 25 August 1996
Volume: 2
ISBN (Paper): 0-8186-7282-X
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.1996.546931
Regular:

Statistical geometric features (SGF) have recently been proposed for the classification of image textures. The SGF method is easily extended to use other geometric properties of connected regions.... View More

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